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If there is a software that analyzes the image quality of digital input devices according to the ISO standards it is the IE-Analyzer. This tool is developed by Image Engineering, an independent test lab in Germany that tests more than 200 different cameras per year and uses the software itself. 10 years of experience in camera and scanner testing are incorporated in the IE-Analyzer and in combination with the system test charts there is nothing comparable on the market.
The principle
It is very easy to test a specific characteristic of a digital input device using the IE-Analyzer. Just take one or multiple pictures of the related test target under defined lighting conditions (by the way we also offer illumination systems like integrating spheres or our AF box.). Open the image in the adequate software module, press the start button and a few seconds later the result will be displayed. End of March we will start shipping the new version IE-Analyzer 4 that supports a huge variety of test targets. You will get a newsletter with a more detailed description at that time. 25 reasons to upgrade to Analyzer 4? 1. Support of Scanner charts for Dynamic Range (ISO21550), Color (IT8),
Resolution (ISO 16067)
2. Batch processing in all modules
3. Image display and zoom function in all modules
4. Support of current ISO 15739 revision
5. Automatic ROI detection in all modules
6. Use of illuminance, luminance or density values in OECF module
7. CIE L and C (Lab Space) display in OECF module
8. Dynamic Range calculation based on total and temporal noise
10. Support of different white point settings in color module
11. Grouping of patches for evaluation in color module
12. Support of slanted edges for resolution measurements (edge width and edge SFR)
13. Calculation of Kurtosis value for white noise patches
14. Calculation of visual MTF (Acutance) with adjustable viewing conditions
15. Calculation of visual noise in shading images
16. Lab based shading calculation
17. Delta E_ab based color nonuniformity calculation
18. Colored contour plot
19. Calculation of geometric distortion
20. Calculation of polynomial for distortion and output of coefficients
21. 2D and vector plot for distortion
22. Distortion plot versus image height
23. New histogram analysis for determination of dead pixels based on mean values,
thresholds and noise level
24. Creation of pixel map for dead pixels
25. Support of many charts of the Esser Test Chart Series In order to get to know the Analyzer 4 and the Esser Test Chart testing solutions Dietmar Wueller will present a series of free seminars on a worldwide tour in April and May 2009. Don’t miss it and reserve your seat right away.
Here are the dates and locations 02nd of April, 3:30 p.m. – 6:30 p.m.
Hong Kong, China
1/F, HKPC Building, 78 Tat Chee Avenue, Kowloon
Contact: bonniesin@dpshk.com
| 6th and 7th of April, 1 p.m. – 5:30 p.m.
Taipei, Taiwan
5F., No. 188 SEC 2, Chung Ching North RD.
Contact: alexlin@asic.com.tw
| 09th and 10th of April, 2 p.m. – 6:00 p.m.
Tokyo, Japan
SYSTEM 5 Tokyo Office 6F, 1F Imon-Kandaekimae Bldg. 1-6-15 Kaji-cho, Chiyoda-ku, Tokyo 101-0044
Contact: kato@system5.co.jp
| 22nd of April, 11:00 a.m. – 4:00 p.m.
with focus on Scanner testing
Frechen (Cologne), Germany
Augustinusstr. 9D, 50226 Frechen
Contact: info@image-engineering.de
| 23rd of April, 11:00 a.m. – 4:00 p.m.
with focus on camera testing
Frechen (Cologne), Germany
Augustinusstr. 9D, 50226 Frechen
Contact: info@image-engineering.de
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The following arrangements are planned but not yet confirmed, exact dates and locations will be published soon.
29th of April, 2:30 p.m. – 4:00 p.m.
Seoul, South Korea
Contact: sales@chartmall.com
28th or 30th of April 2009, or 1st of Mai 2009
Taiwan, Suzhou
Contact:stephanie.lee@gain.com.tw
08th of May, 1:00 p.m. – 5:00 p.m.
Rochester NY, USA
Contact: jdterrey@norterra-tech.com
20th of May, 1:00 p.m. – 5:00 p.m.
San Jose CA, USA
Contact: jdterrey@norterra-tech.com |
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