The TE42-LL UW (Ultra-Wide) version of the TE42-LL (low-light) chart was designed for wide-angle cameras that struggle with accurate resolution measurements due to distortion present in the test images (typical for ultra-wide cameras). This chart uses tartan targets to allow you to analyze resolution even with distortion present.
These tartan patterns are frequency patterns that don’t change, unlike Siemens star patterns, which use a changing pattern. As a result, resolution can be measured more accurately, even with distortion present.
The TE42-LL UW is supported by the iQ-Analyzer-X image evaluation software.
*The exact layout and dimensions may differ from the illustration above.